[This article belongs to Volume - 54, Issue - 02]
Gongcheng Kexue Yu Jishu/Advanced Engineering Science
Journal ID : AES-30-11-2022-501

Title : SPC USING THE LENGTH - BIASED ERLANG – TRUNCATED EXPONENTIAL DISTRIBUTION
S.Abirami1, N.Vijayasankar2

Abstract :

Statistical Process Control (SPC) is an effective tool for achieving process stability. Various control charts have been developed for monitoring uncorrelated observations to detect shifts in the mean of the processes when the quality of interest surveys an ND. In practice, it is only sometimes valid that the variable of interest follows the ND but may also follow non-ND. The variable of interest may have a non-ND, such as an exponential or gamma distribution, or any other. Control charts created for an ND may not be applicable in this case, increasing in the proportion of non-conforming items. In this paper, the Length Biased techniques have been used to the ETED to the applications of SPC to check the shows of the production process. The main objective of this paper is to introduce a control chart using Length Biased ETED to study the production system and monitor the same.